USE OF IMPLANTED SAMPLES AS STANDARDS IN SPARK-SOURCE MASS-SPECTROMETRY WITH APPLICATION TO THE ANALYSIS OF III-V-SEMICONDUCTORS

被引：16

作者：

GAUNEAU, M

RUPERT, A

MINIER, M

REGRENY, O

COQUILLE, R

机构：

来源：

ANALYTICA CHIMICA ACTA | 1982年 / 135卷 / 02期

关键词：

D O I：

10.1016/S0003-2670(01)93900-5

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：193 / 204

页数：12

共 15 条

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