SPATIALLY RESOLVED ELLIPSOMETRY

[1] Aspnes D. E., 1976, OPTICAL PROPERTIES S, P801

[2] HIGH PRECISION SCANNING ELLIPSOMETER [J]. APPLIED OPTICS, 1975, 14 (01): : 220 - 228

[3] DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J]. PHYSICAL REVIEW B, 1983, 27 (02) : 985 - 1009

[4] METHODS FOR DRIFT STABILIZATION AND PHOTOMULTIPLIER LINEARIZATION FOR PHOTOMETRIC ELLIPSOMETERS AND POLARIMETERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (03) : 291 - 297

[5] ASPNES DE, 1981, SPIE P, V276, P227

[6] AZZAM RMA, 1975, ELLIPSOMETRY POLARIZ

[7] ANALYSIS OF ION-IMPLANTED GAAS BY SPECTROSCOPIC ELLIPSOMETRY [J]. SURFACE SCIENCE, 1983, 135 (1-3) : 353 - 373

[8] ERMAN M, 1986, THESIS U PARIS

[9] POLARIZATION OF NONPLANAR WAVE FRONTS [J]. APPLIED OPTICS, 1984, 23 (18): : 3188 - 3195

[10] MACROSCOPIC OPTICAL-MODEL FOR THE ELLIPSOMETRY OF AN UNDERPOTENTIAL DEPOSIT - LEAD ON COPPER AND SILVER [J]. SURFACE SCIENCE, 1983, 135 (1-3) : 521 - 531

[1] Aspnes D. E., 1976, OPTICAL PROPERTIES S, P801

[2] HIGH PRECISION SCANNING ELLIPSOMETER [J]. APPLIED OPTICS, 1975, 14 (01): : 220 - 228

[3] DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J]. PHYSICAL REVIEW B, 1983, 27 (02) : 985 - 1009

[4] METHODS FOR DRIFT STABILIZATION AND PHOTOMULTIPLIER LINEARIZATION FOR PHOTOMETRIC ELLIPSOMETERS AND POLARIMETERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (03) : 291 - 297

[5] ASPNES DE, 1981, SPIE P, V276, P227

[6] AZZAM RMA, 1975, ELLIPSOMETRY POLARIZ

[7] ANALYSIS OF ION-IMPLANTED GAAS BY SPECTROSCOPIC ELLIPSOMETRY [J]. SURFACE SCIENCE, 1983, 135 (1-3) : 353 - 373

[8] ERMAN M, 1986, THESIS U PARIS

[9] POLARIZATION OF NONPLANAR WAVE FRONTS [J]. APPLIED OPTICS, 1984, 23 (18): : 3188 - 3195

[10] MACROSCOPIC OPTICAL-MODEL FOR THE ELLIPSOMETRY OF AN UNDERPOTENTIAL DEPOSIT - LEAD ON COPPER AND SILVER [J]. SURFACE SCIENCE, 1983, 135 (1-3) : 521 - 531