SURFACE OPTICAL COATINGS BY ION ASSISTED DEPOSITION TECHNIQUES - STUDY OF UNIFORMITY

被引:15
作者
FLORY, F
PELLETIER, E
ALBRAND, G
HU, Y
机构
来源
APPLIED OPTICS | 1989年 / 28卷 / 14期
关键词
D O I
10.1364/AO.28.002952
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:2952 / 2959
页数:8
相关论文
共 20 条
[1]   REFRACTIVE-INDEX AND INHOMOGENEITY OF THIN-FILMS [J].
BORGOGNO, JP ;
FLORY, F ;
ROCHE, P ;
SCHMITT, B ;
ALBRAND, G ;
PELLETIER, E ;
MACLEOD, HA .
APPLIED OPTICS, 1984, 23 (20) :3567-3570
[2]   AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS [J].
BORGOGNO, JP ;
LAZARIDES, B ;
PELLETIER, E .
APPLIED OPTICS, 1982, 21 (22) :4020-4029
[3]  
Commandre M., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V805, P128, DOI 10.1117/12.941380
[4]  
Flory F., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V652, P248, DOI 10.1117/12.938387
[5]  
Fornier A., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V652, P27, DOI 10.1117/12.938354
[6]   ION-ASSISTED DEPOSITION OF MGF2 AT AMBIENT-TEMPERATURES [J].
GIBSON, UJ ;
KENNEMORE, CM .
THIN SOLID FILMS, 1985, 124 (01) :27-33
[7]  
GREZESBESSET C, 1988, ANN TELECOMMUN, V43, P135
[8]   LAYER UNIFORMITY OBTAINED BY VACUUM EVAPORATION - APPLICATION TO FABRY-PEROT FILTERS [J].
GREZESBESSET, C ;
RICHIER, R ;
PELLETIER, E .
APPLIED OPTICS, 1989, 28 (14) :2960-2964
[9]  
GREZESBESSET C, 1988, 4TH TOP M OPT INT CO
[10]   MEASUREMENT OF THE PRINCIPAL REFRACTIVE-INDEXES OF THIN-FILMS DEPOSITED AT OBLIQUE-INCIDENCE [J].
HODGKINSON, IJ ;
HOROWITZ, F ;
MACLEOD, HA ;
SIKKENS, M ;
WHARTON, JJ .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (10) :1693-1697