SURFACE FLASHOVER IN SILICON-VACUUM SYSTEMS

被引:6
作者
GRADINARU, G
MADANGARLI, VP
SUDARSHAN, TS
机构
[1] Department of Electrical and Computer Engineering, University of South Carolina, Columbia, SC
来源
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1993年 / 28卷 / 04期
关键词
D O I
10.1109/14.231538
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The properties of the prebreakdown and breakdown response of silicon-vacuum systems under HV excitation are presented. The most frequent case of system breakdown by surface flashover is treated. The particular properties of the system response in the high field pulsed regime demonstrate the essential differences between the silicon-vacuum and solid insulator-vacuum systems. The main ideas of a new physical model of surface flashover in silicon-vacuum systems are presented. The properties of the surface flashover response are discussed in terms of the proposed model. A new concept called 'system surface flashover sensitivity' is introduced for a better understanding of the surface flashover physical process in silicon-vacuum systems.
引用
收藏
页码:555 / 565
页数:11
相关论文
共 20 条
[11]   SURFACE FLASHOVER OF INSULATORS [J].
MILLER, HC .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1989, 24 (05) :765-786
[12]   NEW FINDINGS OF PULSED SURFACE BREAKDOWN ALONG SILICON IN VACUUM [J].
NAM, SH ;
SUDARSHAN, TS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (12) :2466-2471
[13]  
NAM SH, 1990, THESIS U S CAROLINA
[14]  
NUNNALLY WC, 1985, 5TH P IEEE PULS POW, P235
[15]   SURFACE FLASHOVER OF SILICON [J].
PETERKIN, FE ;
RIDOLFI, T ;
BURESH, LL ;
HANKLA, BJ ;
SCOTT, DK ;
WILLIAMS, PF ;
NUNNALLY, WC ;
THOMAS, BL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (12) :2459-2465
[16]   PREBREAKDOWN PROCESSES ASSOCIATED WITH SURFACE FLASHOVER OF SOLID INSULATORS IN VACUUM [J].
SUDARSHAN, TS ;
CROSS, JD ;
SRIVASTAVA, KD .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1977, 12 (03) :200-208
[17]  
SUDARSHAN TS, 1992, 5TH P SDIO ONR PULS, P152
[18]  
THOMAS BL, 1987, 6TH P IEEE PULS POW, P149
[19]  
THOMAS BL, 1989, 7TH P IEEE PULS POW, P893
[20]  
WILLIAMS PF, 1989, 7TH P IEEE PULS POW, P890