SEGREGATION PHENOMENA IN THIN NICR LAYERS

被引:18
作者
KOLTAI, M
TRIFONOV, I
CZERMANN, M
机构
关键词
D O I
10.1016/0042-207X(83)90527-4
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:49 / 52
页数:4
相关论文
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[2]  
HANUSOVSZKY A, UNPUB THIN SOLID FIL
[3]   STRUCTURAL AND ELECTRICAL PROPERTIES OF CHROMIUM AND NICKEL FILMS EVAPORATED IN PRESENCE OF OXYGEN [J].
HIEBER, K ;
LASSAK, L .
THIN SOLID FILMS, 1974, 20 (01) :63-73
[4]   STRUCTURAL AND ELECTRICAL PROPERTIES OF EVAPORATED CR-NI FILMS AS A FUNCTION OF GAS PRESSURE [J].
LASSAK, L ;
HIEBER, K .
THIN SOLID FILMS, 1973, 17 (01) :105-111