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IMPROVED CALIBRATION AND MEASUREMENT OF THE SCATTERING PARAMETERS OF MICROWAVE INTEGRATED-CIRCUITS

被引：38
作者：
PANTOJA, RR
HOWES, MJ
RICHARDSON, JR
POLLARD, RD
机构：
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1989年 / 37卷 / 11期
关键词：
D O I：
10.1109/22.41030
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1675 / 1680
页数：6
相关论文
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1986, 34 (12) :1421-1426
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