A REVISED EXPRESSION FOR SIGNAL NOISE RATIO IN EELS

[1] Bevington P., 1969, DATA REDUCTION ERROR

[2] EGERTON RF, 1976, DEV ELECTRON MICROSC, P129

[3] EGERTON RF, 1978, SCANNING ELECTRON MI, V1, P133

[4] EGERTON RF, UNPUB

[5] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52

[6] ELECTRON-ENERGY LOSS SPECTROSCOPY - DETECTABLE LIMITS FOR ELEMENTAL ANALYSIS [J]. ULTRAMICROSCOPY, 1980, 5 (03) : 333 - 342

[7] Zaluzec N. J., 1981, MICROBEAM ANAL 1981, P329

[1] Bevington P., 1969, DATA REDUCTION ERROR

[2] EGERTON RF, 1976, DEV ELECTRON MICROSC, P129

[3] EGERTON RF, 1978, SCANNING ELECTRON MI, V1, P133

[4] EGERTON RF, UNPUB

[5] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52

[6] ELECTRON-ENERGY LOSS SPECTROSCOPY - DETECTABLE LIMITS FOR ELEMENTAL ANALYSIS [J]. ULTRAMICROSCOPY, 1980, 5 (03) : 333 - 342

[7] Zaluzec N. J., 1981, MICROBEAM ANAL 1981, P329