ION-BEAM DIAGNOSTICS BY MEANS OF PLANE LANGMUIR PROBES

[1] THE DETECTION OF AN ION-BEAM USING AN ELECTRON SATURATED LANGMUIR PROBE [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1980, 49 (04) : 339 - 342

[2] Chen F F, 1965, PLASMA DIAGNOSTIC TE, P113

[3] MONTE-CARLO THEORY AND PRACTICE [J]. REPORTS ON PROGRESS IN PHYSICS, 1980, 43 (09) : 1145 - 1189

[4] PLASMA POTENTIAL MEASUREMENTS BY ELECTRON EMISSIVE PROBES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (04) : 455 - &

[5] NUMERICAL SIMULATION OF WARM 2-BEAM PLASMA [J]. PHYSICS OF FLUIDS, 1969, 12 (11) : 2418 - &

[6] SHEATH EXPANSION OF PLANE PROBE BY ION-BEAM REFLECTION [J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (03) : 1197 - 1201

[7] PAPOULIS A, 1965, PROBABILITY RANDOM V, P126

[8] THEORY OF A SATELLITE ELECTROSTATIC PROBE [J]. ANNALS OF PHYSICS, 1967, 44 (01) : 126 - &

[9] SKOELV A, 1981, THESIS U TROMSO

[10] INFLECTION-POINT METHOD OF INTERPRETING EMISSIVE PROBE CHARACTERISTICS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (02) : 210 - 218

[1] THE DETECTION OF AN ION-BEAM USING AN ELECTRON SATURATED LANGMUIR PROBE [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1980, 49 (04) : 339 - 342

[2] Chen F F, 1965, PLASMA DIAGNOSTIC TE, P113

[3] MONTE-CARLO THEORY AND PRACTICE [J]. REPORTS ON PROGRESS IN PHYSICS, 1980, 43 (09) : 1145 - 1189

[4] PLASMA POTENTIAL MEASUREMENTS BY ELECTRON EMISSIVE PROBES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (04) : 455 - &

[5] NUMERICAL SIMULATION OF WARM 2-BEAM PLASMA [J]. PHYSICS OF FLUIDS, 1969, 12 (11) : 2418 - &

[6] SHEATH EXPANSION OF PLANE PROBE BY ION-BEAM REFLECTION [J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (03) : 1197 - 1201

[7] PAPOULIS A, 1965, PROBABILITY RANDOM V, P126

[8] THEORY OF A SATELLITE ELECTROSTATIC PROBE [J]. ANNALS OF PHYSICS, 1967, 44 (01) : 126 - &

[9] SKOELV A, 1981, THESIS U TROMSO

[10] INFLECTION-POINT METHOD OF INTERPRETING EMISSIVE PROBE CHARACTERISTICS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (02) : 210 - 218