NOISE ASSOCIATED WITH CHARGE INJECTION INTO A CCD BY CURRENT INTEGRATION THROUGH A MOS-TRANSISTOR

被引：4

作者：

REIMBOLD, G ^{[1
]}

机构：

[1] INST NATL POLYTECH GRENOBLE,ECOL NATL SUPER ELECTR & RADIOELECT GRENOBLE,F-3803 GRENOBLE,FRANCE

来源：

关键词：

D O I：

10.1109/T-ED.1985.22040

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：871 / 873

页数：3

共 7 条

[1] KTC NOISE ON DIRECT INJECTION FROM IR-DIODES [J].

BUSS, DD ;

KANSY, RJ ;

BARTON, JB .

[2] NOISE MEASUREMENTS IN CHARGE-COUPLED-DEVICES [J].

MOHSEN, AM ;

TOMPSETT, MF ;

SEQUIN, CH .

REIMBOLD, G .

[4] WHITE NOISE OF MOS-TRANSISTORS OPERATING IN WEAK INVERSION [J].

REIMBOLD, G ;

GENTIL, P .

[5]

REIMBOLD G, 1983, THESIS INP GRENOBLE

[6]

REIMBOLD G, 1983, 7TH P INT C NOIS PHY, P295

[7] SPECTRAL DENSITY OF NOISE GENERATED IN CHARGE-TRANSFER DEVICES [J].

THORNBER, KK ;

TOMPSETT, MF .