STATUS OF A SILICON LATTICE MEASUREMENT AND DISSEMINATION EXERCISE

被引：21

作者：

DESLATTES, RD

KESSLER, EG

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1991年 / 40卷 / 02期

关键词：

D O I：

10.1109/TIM.1990.1032890

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Although no longer explicitly directed toward measurement of the Avogadro constant, we continue significant effort on lattice period measurement in monocrystalline silicon. There are currently operating an upgraded x-ray/optical interferometer and a recently established lattice comparator. We report the status of measurements with these two instruments.

引用

页码：92 / 97

页数：6