PROPERTIES OF YBACUO THIN-FILM SINGLE-LEVEL DC-SQUIDS FABRICATED USING STEP-EDGE JUNCTIONS

被引：6

作者：

SUN, JZ ^{[1
]}

YUJAHNES, LS ^{[1
]}

FOGLIETTI, V ^{[1
]}

KOCH, RH ^{[1
]}

GALLAGHER, WJ ^{[1
]}

机构：

[1] CNR, IST ELETTR DELLO STATO SOLIDO, ROME, ITALY

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期

关键词：

D O I：

10.1109/77.402999

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A quantitative comparison study of single-level step-edge junction-based SQUIDs and bicrystal-substrate-based SQUIDs is given, Similar SQUID performance was found in terms of white flux noise level and junction-critical-current-related 1/f noise. Excess current was found in most step-edge devices, Issues related to systems applications, such as magnetic field-induced noise, junction cyclability upon repeated use, and environmental stability of oxide-metal contacts are also discussed.

引用

收藏

页码：2107 / 2111

页数：5

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