UPDATE ON PARTS SEE SUSCEPTIBILITY FROM HEAVY-IONS

被引：8

作者：

NICHOLS, DK ^{[1
]}

SMITH, LS ^{[1
]}

SCHWARTZ, HR ^{[1
]}

SOLI, G ^{[1
]}

WATSON, K ^{[1
]}

KOGA, R ^{[1
]}

CRAIN, WR ^{[1
]}

CRAWFORD, KB ^{[1
]}

HANSEL, SJ ^{[1
]}

LAU, DD ^{[1
]}

机构：

[1] AEROSPACE CORP,SPACE SCI LAB,EL SEGUNDO,CA 90245

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1991年 / 38卷 / 06期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1109/23.124142

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Jet Propulsion Laboratory (JPL) and The Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data since their last joint contributions to IEEE Transactions on Nuclear Science in December 1985, 1987, and 1989. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed.

引用

页码：1529 / 1539

页数：11

共 6 条

[1] SEU TEST TECHNIQUES FOR 256K STATIC RAMS AND COMPARISONS OF UPSETS INDUCED BY HEAVY-IONS AND PROTONS [J].