共 15 条
[2]
RAMAN-SPECTROSCOPY - VERSATILE TOOL FOR CHARACTERIZATION OF THIN-FILMS AND HETEROSTRUCTURES OF GAAS AND ALXGA1-XAS
[J].
APPLIED PHYSICS,
1978, 16 (04)
:345-352
[3]
BUBE RH, 1974, ELECTRONIC PROPERTIE, P457
[5]
TEMPERATURE DEPENDENCE OF RAMAN SCATTERING IN SILICON
[J].
PHYSICAL REVIEW B-SOLID STATE,
1970, 1 (02)
:638-&
[6]
Murase K., 1975, Progress of Theoretical Physics Supplement, P115, DOI 10.1143/PTPS.57.115
[7]
MYERS DR, 1982, I PHYS C SER, V65, P635
[9]
Nakamura T., UNPUB
[10]
LO-PHONON-PLASMON DISPERSION IN GAAS - HYDRODYNAMICAL THEORY AND EXPERIMENTAL RESULTS
[J].
PHYSICA STATUS SOLIDI B-BASIC RESEARCH,
1981, 108 (01)
:131-143