CHARACTERIZATION OF PHASE NOISE IN SEMICONDUCTOR-LASERS

被引：38

作者：

PIAZZOLLA, S

SPANO, P

TAMBURRINI, M

机构：

来源：

APPLIED PHYSICS LETTERS | 1982年 / 41卷 / 08期

关键词：

D O I：

10.1063/1.93654

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：695 / 696

页数：2

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[1] BORN M, 1975, PRINCIPLES OPTICS, P267
[2] SOME ASPECTS OF THEORY AND MEASUREMENT OF FREQUENCY FLUCTUATIONS IN FREQUENCY STANDARDS
CUTLER, LS
SEARLE, CL
[J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 136 - &
[3] PHASE NOISE OF SINGLE-MODE DIODE-LASERS IN INTERFEROMETER SYSTEMS
DANDRIDGE, A
TVETEN, AB
[J]. APPLIED PHYSICS LETTERS, 1981, 39 (07) : 530 - 532
[4] SINGLE-MODE DIODE-LASER PHASE NOISE
DANDRIDGE, A
TVETEN, AB
MILES, RO
JACKSON, DA
GIALLORENZI, TG
[J]. APPLIED PHYSICS LETTERS, 1981, 38 (02) : 77 - 78
[5] FUNDAMENTAL LINE BROADENING OF SINGLE-MODE (GAAL)AS DIODE-LASERS
FLEMING, MW
MOORADIAN, A
[J]. APPLIED PHYSICS LETTERS, 1981, 38 (07) : 511 - 513
[6] THEORY OF THE LINEWIDTH OF SEMICONDUCTOR-LASERS
HENRY, CH
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (02) : 259 - 264
[7] PRELIMINARY MEASUREMENTS OF LASER SHORT-TERM FREQUENCY FLUCTUATIONS
SIEGMAN, AE
DAINO, B
MANES, KR
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1967, QE 3 (05) : 180 - +
[8] THOMPSON GHB, 1980, PHYSICS SEMICONDUCTO, pCH7
[9] OBSERVATION OF LINEWIDTH BROADENING IN (GAAL)AS DIODE-LASERS DUE TO ELECTRON NUMBER FLUCTUATIONS
WELFORD, D
MOORADIAN, A
[J]. APPLIED PHYSICS LETTERS, 1982, 40 (07) : 560 - 562