REDUCED THICKNESS OF CONTAMINATION LAYERS DETERMINED FROM C-1S-LINES AND CKVV-LINES

被引：16

作者：

EBEL, MF ^{[1
]}

SCHMID, M ^{[1
]}

EBEL, H ^{[1
]}

VOGEL, A ^{[1
]}

机构：

[1] TECH UNIV WIEN, INST WERKSTOFFKUNDE & MAT PRUFUNG, VIENNA, AUSTRALIA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1984年 / 34卷 / 03期

关键词：

D O I：

10.1016/0368-2048(84)80076-6

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：313 / 316

页数：4

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