FLUORESCENCE CORRECTIONS IN THIN-FILM TEXTURE ANALYSIS

被引：2

作者：

CHATEIGNER, D ^{[1
]}

GERMI, P ^{[1
]}

PERNET, M ^{[1
]}

FRECHARD, P ^{[1
]}

ANDRIEU, S ^{[1
]}

机构：

[1] CRPAM,UMR 37,LAB MIXTE CNRS ST GOBAIN,PONT A MOUSSON,FRANCE

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1995年 / 28卷

关键词：

D O I：

10.1107/S0021889895001750

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

This paper reviews the transmission and reflection texture techniques in order to develop the correction formulae in each of these methods for application to fluorescent thin-film analysis. The method is applied to iron samples deposited on glass substrates in order to prove the efficiency of these corrections in the case of the Schulz reflection geometry. The columnar growth of these films is shown to be dependent on the incident flux inclination.

引用

页码：369 / 374

页数：6

共 14 条

[1]

BUNGE HJ, 1982, QUANTITATIVE TEXTURE, P85

[2] TEXTURE ANALYSIS BY THE SCHULZ REFLECTION METHOD - DEFOCALIZATION CORRECTIONS FOR THIN-FILMS [J].

CHATEIGNER, D ;

GERMI, P ;

PERNET, M .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 :766-769

[3]

DECKER BF, 1947, J APPL PHYS, V19, P388

[4]

EBERHART JP, 1989, ANAL STRUCTURALE CHI, P319

[5] DETERMINATION OF RELATIVE INTENSITY IN X-RAY REFLECTION STUDY [J].

FENG, C .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) :3432-&

[6] REFLECTION METHOD OF DETERMINING PREFERRED ORIENTATION ON THE GEIGER-COUNTER SPECTROMETER [J].

FIELD, M ;

MERCHANT, ME .

JOURNAL OF APPLIED PHYSICS, 1949, 20 (08) :741-745

[7] INFLUENCE OF INSTRUMENTAL ABERRATIONS ON THE SCHULTZ TECHNIQUE FOR THE MEASUREMENT OF POLE FIGURES [J].

GALE, B ;

GRIFFITHS, D .

BRITISH JOURNAL OF APPLIED PHYSICS, 1960, 11 (03) :96-102

[8] PHYSICAL PROBLEMS CONCERNING EFFUSION PROCESSES OF SEMICONDUCTORS IN MOLECULAR-BEAM EPITAXY [J].

HERMAN, MA .

VACUUM, 1982, 32 (09) :555-565

[9] BIAXIALLY ALIGNED YBA2CU3O7-X THIN-FILM TAPES [J].

IIJIMA, Y ;

TANABE, N ;

IKENO, Y ;

KOHNO, O .

PHYSICA C, 1991, 185 :1959-1960

[10]

Leamy H. J., 1980, Current topics in materials science. Vol.6, P309

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