TRANSPORT STUDY OF SELF-SUPPORTING POROUS SILICON

被引:26
作者
FEJFAR, A
PELANT, I
SIPEK, E
KOCKA, J
JUSKA, G
MATSUMOTO, T
KANEMITSU, Y
机构
[1] NIPPON STEEL CORP LTD, ELECTR RES LABS, SAGAMIHARA, KANAGAWA 229, JAPAN
[2] UNIV TSUKUBA, INST PHYS, TSUKUBA, IBARAKI 305, JAPAN
关键词
D O I
10.1063/1.113584
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have measured dark DC conductivity and time-of-flight (TOF) of carriers in self-supporting porous silicon films in the temperature range 298-480 K. The dark I-V curves show superlinear behavior with activation energies of 0.38-0.67 eV. The TOF measurements allowed us to evaluate the drift-length of non-equilibrium carriers and revealed a significant decrease of the collected charge with increasing delay (tdel≥1 ms) of the exciting 3 ns laser pulse after the voltage application, probably due to field redistribution in the Si crystallites.© 1995 American Institute of Physics.
引用
收藏
页码:1098 / 1100
页数:3
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