TRANSMISSION ELECTRON MICROSCOPY OF CLEAVED SILICON

被引：25

作者：

FRANKL, DR

机构：

来源：

关键词：

D O I：

10.1063/1.1729250

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3514 / &

共 12 条

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