CORRELATION OF DISPLACEMENT EFFECTS PRODUCED BY ELECTRONS PROTONS AND NEUTRONS IN SILICON

被引:37
作者
VANLINT, VAJ [1 ]
GIGAS, G [1 ]
BARENGOLTZ, J [1 ]
机构
[1] CALTECH, JET PROP LAB, PASADENA, CA 91109 USA
关键词
D O I
10.1109/TNS.1975.4328186
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:2663 / 2668
页数:6
相关论文
共 31 条
[1]  
AFANASEV VN, 1971, SOV PHYS SEMICOND+, V5, P944
[2]   RADIATION-INDUCED CHANGES IN SILICON PHOTOVOLTAIC CELLS [J].
BAICKER, JA ;
FAUGHNAN, BW .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (11) :3271-+
[3]  
BEATTY ME, 1969, D5028TN NASA TECHN N
[4]   INFLUENCE OF INJECTION RATE ON CARRIER LIFETIME DEGRADATION IN P-TYPE SILICON IRRADIATED BY 4.5 MEV ELECTRONS [J].
BIELLEDA.D ;
POUGET, M .
NUCLEAR INSTRUMENTS & METHODS, 1971, 93 (03) :413-&
[5]  
BILINSKI JR, 1963, IEEE T NUCL SCI, V12, P71
[6]  
BROWN RR, 1969, CR814 NASA REP
[7]  
CARTER JR, 1966, CR404 NASA CONTR REP
[8]  
CORBETT JW, 1966, SOLID STATE PHYSI S7
[10]  
DENNY JM, 1961, STL89870001RV000 REP