OXIDATION AND INTERFACE STATES IN A-SI-H

被引:35
作者
STREET, RA
KNIGHTS, JC
机构
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1981年 / 43卷 / 06期
关键词
D O I
10.1080/01418638108222576
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1091 / 1098
页数:8
相关论文
共 18 条
[1]   THICKNESS DEPENDENT CONDUCTIVITY OF N-TYPE HYDROGENATED AMORPHOUS-SILICON [J].
AST, DG ;
BRODSKY, MH .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 35-6 (JAN-) :611-616
[2]   HYDROGEN EVOLUTION AND DEFECT CREATION IN AMORPHOUS SI-H ALLOYS [J].
BIEGELSEN, DK ;
STREET, RA ;
TSAI, CC ;
KNIGHTS, JC .
PHYSICAL REVIEW B, 1979, 20 (12) :4839-4846
[3]   ESR CENTERS, INTERFACE STATES, AND OXIDE FIXED CHARGE IN THERMALLY OXIDIZED SILICON WAFERS [J].
CAPLAN, PJ ;
POINDEXTER, EH ;
DEAL, BE ;
RAZOUK, RR .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (09) :5847-5854
[4]   THERMALIZATION AND RECOMBINATION OF EXCESS CARRIERS IN A-SI-H [J].
FISCHER, R ;
REHM, W ;
STUKE, J ;
VOGETGROTE, U .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 35-6 (JAN-) :687-692
[5]   POROSITY AND OXIDATION OF AMORPHOUS SILICON FILMS PREPARED BY EVAPORATION, SPUTTERING AND PLASMA-DEPOSITION [J].
FRITZSCHE, H ;
TSAI, CC .
SOLAR ENERGY MATERIALS, 1979, 1 (5-6) :471-479
[6]   ELECTRON-SPIN RESONANCE AND HOPPING CONDUCTIVITY OF A-SIOX [J].
HOLZENKAMPFER, E ;
RICHTER, FW ;
STUKE, J ;
VOGETGROTE, U .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 32 (1-3) :327-338
[7]  
JOHNSON NM, 1980, PHYSICS MOS INSULATO, P311
[8]  
Knights J. C., 1979, JPN J APPL PHYS, V18, P101
[9]   MICROSTRUCTURE OF PLASMA-DEPOSITED A-SI-H FILMS [J].
KNIGHTS, JC ;
LUJAN, RA .
APPLIED PHYSICS LETTERS, 1979, 35 (03) :244-246
[10]   ELECTRONIC AND STRUCTURAL-PROPERTIES OF PLASMA-DEPOSITED A-SI-O-H - STORY OF O2 [J].
KNIGHTS, JC ;
STREET, RA ;
LUCOVSKY, G .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 35-6 (JAN-) :279-284