学术探索
学术期刊
新闻热点
数据分析
智能评审

UNDERSTANDING SINGLE EVENT PHENOMENA IN COMPLEX ANALOG AND DIGITAL INTEGRATED-CIRCUITS

被引：16
作者：
TURFLINGER, TL
DAVEY, MV
机构：
[1] Naval Weapons Support Center, Crane
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1990年 / 37卷 / 06期
关键词：
D O I：
10.1109/23.101197
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Single Event Phenomena (SEP) response of complex analog and digital integrated circuits (IC's) cannot be characterized using common (i.e., memory) techniques. A technique for such characterization is developed and discussed. The technique is used to analyze SEP response of an Analog-to-Digital Converter (ADC). © 1990 IEEE
引用
收藏
页码：1832 / 1838
页数：7
相关论文
共 6 条
[1]   THE NATURAL RADIATION ENVIRONMENT INSIDE SPACECRAFT [J].
ADAMS, JH .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2095-2100
[2]   TECHNIQUES OF MICROPROCESSOR TESTING AND SEU-RATE PREDICTION [J].
KOGA, R ;
KOLASINSKI, WA ;
MARRA, MT ;
HANNA, WA .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4219-4224
[3]  
Newberry Daniel O., 1971, COMMUNICATION
[4]   SUGGESTED SINGLE EVENT UPSET FIGURE OF MERIT [J].
PETERSEN, EL ;
LANGWORTHY, JB ;
DIEHL, SE .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4533-4539
[5]   TRANSIENT RADIATION TEST TECHNIQUES FOR HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS [J].
TURFLINGER, TL ;
DAVEY, MV .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1989, 36 (06) :2356-2361
[6]   SINGLE-EVENT UPSET (SEU) MODEL VERIFICATION AND THRESHOLD DETERMINATION USING HEAVY-IONS IN A BIPOLAR STATIC RAM [J].
ZOUTENDYK, JA ;
SMITH, LS ;
SOLI, GA ;
THIEBERGER, P ;
WEGNER, HE .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4164-4169
1