LABORATORY EXAFS SPECTROMETER WITH A BENT CRYSTAL, A SOLID-STATE DETECTOR, AND A FAST DETECTION SYSTEM

被引：61

作者：

TOHJI, K ^{[1
]}

UDAGAWA, Y ^{[1
]}

KAWASAKI, T ^{[1
]}

MASUDA, K ^{[1
]}

机构：

[1] RIGAKU DENKI CO,AKISHIMA,TOKYO 196,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1983年 / 54卷 / 11期

关键词：

D O I：

10.1063/1.1137288

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1482 / 1487

页数：6

共 16 条

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