OBSERVATIONS OF SPUTTERING DAMAGE USING FIELD-ION MICROSCOPE

被引：13

作者：

WALLS, JM

SOUTHWORTH, HN

BRAUN, E

机构：

[1] UNIV BIRMINGHAM,DEPT PHYS MET & SCI MAT,POB 363,BIRMINGHAM B15 2TT,ENGLAND

[2] UNIV ASTON,DEPT PHYS,GOSTA GREEN,BIRMINGHAM B4 7ET,ENGLAND

来源：

VACUUM | 1974年 / 24卷 / 10期

关键词：

D O I：

10.1016/0042-207X(74)90008-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：471 / 474

页数：4

共 24 条

[1]

Balluffi R. W., 1970, VACANCIES INTERSTITI, P125

[2]

BALUFFI RW, 1970, VACANCIES INTERSTITI, P125

[3]

BARBER DJ, 1970, J MATER SCI, V5, P1, DOI 10.1007/BF02427178

[4] BRIGHT-SPOT IMAGES IN FIELD ION MICROGRAPHS OF IRRADIATED TUNGSTEN [J].

BUSWELL, JT .

PHILOSOPHICAL MAGAZINE, 1971, 23 (182) :293-&

[5]

Carter G., 1968, ION BOMBARDMENT SOLI

[6] IN-SITU CLEANING OF SPECIMENS IN FIELD-ION MICROSCOPE BY ARGON ION-BOMBARDMENT [J].

CRANSTOUN, GK ;

BROWNING, DJ ;

PYKE, DR .

SURFACE SCIENCE, 1973, 34 (03) :597-612

[7] ION INDUCED RE-EMISSION OF NOBLE GAS ATOMS FROM POLYCRYSTALLINE TUNGSTEN .2. [J].

ERENTS, K ;

CARTER, G .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1969, 2 (05) :711-&

[8]

ERENTS K, 1969, J PHYS D, V2, P495

[9] APPLICATION OF THE ION BOMBARDMENT CLEANING METHOD TO TITANIUM, GERMANIUM, SILICON, AND NICKEL AS DETERMINED BY LOW-ENERGY ELECTRON DIFFRACTION [J].

FARNSWORTH, HE ;

SCHLIER, RE ;

GEORGE, TH ;

BURGER, RM .

JOURNAL OF APPLIED PHYSICS, 1958, 29 (08) :1150-1161

[10]

Farrell G., 1970, Radiation Effects, V3, P249, DOI 10.1080/00337577008236282

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