THICKNESS DEPENDENCE OF A DIRECT-CURRENT BREAKDOWN FIELD IN STEARIC-ACID FILMS

被引：7

作者：

HUANG, CH ^{[1
]}

AGARWAL, VK ^{[1
]}

机构：

[1] TEXAS TECH UNIV, DEPT PHYS & ENGN PHYS, LUBBOCK, TX 79409 USA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1985年 / 3卷 / 05期

关键词：

D O I：

10.1116/1.572915

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2000 / 2003

页数：4

共 35 条

[1]

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[2]

Agarwal V. K., 1974, Electrocomponent Science and Technology, V1, P87, DOI 10.1155/APEC.1.87

[3]

AGARWAL VK, 1976, JPN J APPL PHYS, V15, P2327, DOI 10.1143/JJAP.15.2327

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AGARWAL, VK ;

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[5] THICKNESS DEPENDENT STUDIES OF DIELECTRIC BREAKDOWN IN LANGMUIR THIN MOLECULAR FILMS [J].

AGARWAL, VK ;

SRIVASTA.VK .

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[6] INTERPRETATION OF DESTRUCTIVE BREAKDOWN IN LANGMUIR MOLECULAR FILMS [J].

AGARWAL, VK .

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[7] BREAKDOWN CONDUCTION IN LANGMUIR FILMS OF LOW THICKNESSES [J].

AGARWAL, VK .

THIN SOLID FILMS, 1974, 23 (01) :S3-S7

[8] THICKNESS DEPENDENCE OF BREAKDOWN FIELD [J].

AGARWAL, VK ;

SRIVASTA.VK .

THIN SOLID FILMS, 1972, 13 (02) :S23-S24

[9] AC BREAKDOWN STUDIES OF BUILT-UP BARIUM STEARATE FILMS [J].

AGARWAL, VK ;

SRIVASTAVA, VK .

JOURNAL OF APPLIED PHYSICS, 1973, 44 (06) :2900-2901

[10] EVAPORATED-FILMS OF STEARIC ACID STUDIED BY X-RAY-DIFFRACTION [J].

AGARWAL, VK ;

IGASAKI, Y ;

MITSUHASHI, H .

THIN SOLID FILMS, 1976, 33 (03) :L31-L35

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