THICKNESS DEPENDENT STUDIES OF DIELECTRIC BREAKDOWN IN LANGMUIR THIN MOLECULAR FILMS

被引：19

作者：

AGARWAL, VK ^{[1
]}

SRIVASTA.VK ^{[1
]}

机构：

[1] UNIV ROORKEE, DEPT PHYS, ROORKEE, INDIA

来源：

SOLID STATE COMMUNICATIONS | 1973年 / 12卷 / 09期

关键词：

D O I：

10.1016/0038-1098(73)90088-4

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

收藏

页码：829 / 834

页数：6

相关论文

共 23 条

[1] TEMPERATURE DEPENDENCE OF DC DESTRUCTIVE BREAKDOWN FIELD IN BUILT-UP BARIUM STEARATE FILMS
AGARWAL, DK
SRIVASTAVA, VK
[J]. SOLID STATE COMMUNICATIONS, 1972, 11 (10) : 1461 - +
[2] TEMPERATURE-DEPENDENCE OF BREAKDOWN FIELD IN BARIUM STEARATE MULTILAYER FILMS
AGARWAL, DK
SRIVASTAVA, VK
[J]. THIN SOLID FILMS, 1972, 14 (02) : 367 - 371
[3] THICKNESS DEPENDENCE OF BREAKDOWN FIELD IN THIN FILMS
AGARWAL, VK
SRIVASTAVA, VK
[J]. THIN SOLID FILMS, 1971, 8 (05) : 377 - +
[4] THICKNESS DEPENDENCE OF BREAKDOWN FIELD
AGARWAL, VK
SRIVASTA.VK
[J]. THIN SOLID FILMS, 1972, 13 (02) : S23 - S24
[5] AGARWAL VK, IN PRESS
[6] Films built by depositing successive monomolecular layers on a solid surface
Blodgett, KB
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1935, 57 (01) : 1007 - 1022
[7] Built-up films of barium stearate and their optical properties
Blodgett, KB
Langmuir, I
[J]. PHYSICAL REVIEW, 1937, 51 (11): : 0964 - 0982
[8] BREAKDOWN CONDUCTION IN AL-SIO-AL CAPACITORS
BUDENSTEIN, PP
HAYES, PJ
[J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (07) : 2837 - +
[9] DESTRUCTIVE BREAKDOWN IN THIN FILMS OF SIO MGF2 CAF2 CEF3 CEO2 AND TEFLON
BUDENSTEIN, PP
HAYES, PJ
SMITH, JL
SMITH, WB
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (02): : 289 - +
[10] INTERPRETATION OF DESTRUCTIVE BREAKDOWN IN THIN DIELECTRIC FILMS
BUDENSTEIN, PP
HAYES, PJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 602 - +