CURVE FITTING XPS SPECTRA

[11] DAMPED LEAST-SQUARES METHOD FOR AUTOMATIC LENS DESIGN [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (09) : 1105 - &

[12] NASH JC, 1977, J I MATH APPL, V19, P231

[13] OTTOY JP, 1985, SOFTWARE ENG PROBLEM, P71

[14] A COMPARISON OF OPTIMIZATION METHODS FOR FITTING CURVES TO INFRARED BAND ENVELOPES [J]. CANADIAN JOURNAL OF CHEMISTRY, 1966, 44 (24): : 3031 - &

[15] INELASTIC BACKGROUND AND PEAK AREA DETERMINATION IN X-RAY PHOTOELECTRON-SPECTROSCOPY (ESCA) [J]. APPLIED SPECTROSCOPY, 1984, 38 (04) : 505 - 518

[16] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF THE SURFACE OF SPUTTER ION PLATED FILMS [J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (06) : 261 - 266

[17] Sherwood P.M.A., 1983, PRACTICAL SURFACE AN, P445

[18] SMITH DF, 1978, THESIS U N CAROLINA

[19] SPANG HA, 1962, SIAM REV, V4, P343

[20] TOUGAARD S, 1983, SURF SCI, V124, P460

[11] DAMPED LEAST-SQUARES METHOD FOR AUTOMATIC LENS DESIGN [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (09) : 1105 - &

[12] NASH JC, 1977, J I MATH APPL, V19, P231

[13] OTTOY JP, 1985, SOFTWARE ENG PROBLEM, P71

[14] A COMPARISON OF OPTIMIZATION METHODS FOR FITTING CURVES TO INFRARED BAND ENVELOPES [J]. CANADIAN JOURNAL OF CHEMISTRY, 1966, 44 (24): : 3031 - &

[15] INELASTIC BACKGROUND AND PEAK AREA DETERMINATION IN X-RAY PHOTOELECTRON-SPECTROSCOPY (ESCA) [J]. APPLIED SPECTROSCOPY, 1984, 38 (04) : 505 - 518

[16] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF THE SURFACE OF SPUTTER ION PLATED FILMS [J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (06) : 261 - 266

[17] Sherwood P.M.A., 1983, PRACTICAL SURFACE AN, P445

[18] SMITH DF, 1978, THESIS U N CAROLINA

[19] SPANG HA, 1962, SIAM REV, V4, P343

[20] TOUGAARD S, 1983, SURF SCI, V124, P460