SEPARATION OF MAGNETIC AND TOPOGRAPHIC EFFECTS IN FORCE MICROSCOPY

被引：40

作者：

SCHONENBERGER, C ^{[1
]}

ALVARADO, SF ^{[1
]}

LAMBERT, SE ^{[1
]}

SANDERS, IL ^{[1
]}

机构：

[1] IBM CORP,ALMADEN RES CTR,INST MAGNET RECORDING,SAN JOSE,CA 95120

来源：

JOURNAL OF APPLIED PHYSICS | 1990年 / 67卷 / 12期

关键词：

D O I：

10.1063/1.344511

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Several techniques are presented which allow magnetic force microscopy to be performed while simultaneously mapping the surface topographic features of a magnetic sample. The separation of magnetic and topographic features measured simultaneously with a scanning force microscope is made possible by an instrument based on a differential interferometer that can detect cantilever deflections of 0.005 nm at a frequency as low as 1 Hz. Two different applications are presented.

引用

页码：7278 / 7280

页数：3

共 16 条

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