LOW-THRESHOLD HIGH-EFFICIENCY HIGH-YIELD IMPURITY-INDUCED LAYER DISORDERING LASER BY SELF-ALIGNED SI-ZN DIFFUSION

被引:12
作者
ZOU, WX
LAW, KK
GOSSARD, AC
HU, EL
COLDREN, LA
MERZ, JL
机构
关键词
D O I
10.1063/1.103847
中图分类号
O59 [应用物理学];
学科分类号
摘要
Stripe geometry lasers defined by impurity-induced layer disordering (IILD) have been fabricated utilizing a novel technology of self-aligned Si-Zn diffusion from which both optical and electrical confinements are obtained simultaneously. The fabrication process is considerably simpler than that for the conventional IILD lasers and the parasitic p-n junction area in the laser structures is minimized. Typical lasers with threshold current I th=5.2 mA and differential quantum efficiency ηd=81% at room-temperature continuous operation as well as highly uniform yield ≳80% have been obtained.
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页码:2534 / 2536
页数:3
相关论文
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