AUGER-ELECTRON SPECTROSCOPY AT HIGH SPATIAL-RESOLUTION AND NA PRIMARY BEAM CURRENTS

[1] USE OF SCANNING AUGER MICROSCOPY IN MOLECULAR-BEAM EPITAXY OF GAAS AND GAP [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 136 - 139

[2] BOTTOMS WR, 1972, SCANNING ELECTRON MI, P182

[3] Brandis E. K., 1975, Scanning Electron Microscopy 1975, P141

[4] BRANDIS EK, 1971, SEM 1971 1, P505

[5] Christou A., 1975, Scanning Electron Microscopy 1975, P149

[6] ECKSTEIN W, 1972, VACUUM, V23, P159

[7] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &

[8] AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES [J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 315 - +

[9] MACDONALD NC, 1971, SCANNING ELECTRON MI, P89

[10] MACDONALD NC, 1970, SCANNING ELECTRON MI, P25

[1] USE OF SCANNING AUGER MICROSCOPY IN MOLECULAR-BEAM EPITAXY OF GAAS AND GAP [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 136 - 139

[2] BOTTOMS WR, 1972, SCANNING ELECTRON MI, P182

[3] Brandis E. K., 1975, Scanning Electron Microscopy 1975, P141

[4] BRANDIS EK, 1971, SEM 1971 1, P505

[5] Christou A., 1975, Scanning Electron Microscopy 1975, P149

[6] ECKSTEIN W, 1972, VACUUM, V23, P159

[7] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &

[8] AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES [J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 315 - +

[9] MACDONALD NC, 1971, SCANNING ELECTRON MI, P89

[10] MACDONALD NC, 1970, SCANNING ELECTRON MI, P25