AN IMPORTANT STEP IN QUANTITATIVE AUGER ANALYSIS - THE USE OF PEAK TO BACKGROUND RATIO

[11] MONTE-CARLO CALCULATION OF THE SECONDARY-ELECTRON EMISSION OF NORMAL METALS .2. RESULTS FOR ALUMINUM [J]. SURFACE SCIENCE, 1979, 83 (02) : 519 - 530

[12] GANACHAUD JP, 1977, THESIS U NANTES

[13] GILLET E, 1983, VIDE COUCHES MINCES, V216, P107

[14] GRYSINSKI M, 1965, PHYS REV A, VA138, P336

[15] GSPANN JP, 1980, 4TH P INT C TIT KYOT

[16] EFFECT OF SURFACE-ROUGHNESS ON AUGER-ELECTRON SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 7 (03) : 215 - 232

[17] ICHIMURA S, 1983, SURF SCI, V124, pL49, DOI 10.1016/0039-6028(83)90791-4

[18] RATIO TECHNIQUE FOR MICRO-AUGER ANALYSIS [J]. SURFACE SCIENCE, 1977, 62 (01) : 277 - 292

[19] LEHERICY J, 1981, ANALUSIS, V9, P188

[20] MCGUIRE GE, 1979, AUGER ELECTRON SPECT

[11] MONTE-CARLO CALCULATION OF THE SECONDARY-ELECTRON EMISSION OF NORMAL METALS .2. RESULTS FOR ALUMINUM [J]. SURFACE SCIENCE, 1979, 83 (02) : 519 - 530

[12] GANACHAUD JP, 1977, THESIS U NANTES

[13] GILLET E, 1983, VIDE COUCHES MINCES, V216, P107

[14] GRYSINSKI M, 1965, PHYS REV A, VA138, P336

[15] GSPANN JP, 1980, 4TH P INT C TIT KYOT

[16] EFFECT OF SURFACE-ROUGHNESS ON AUGER-ELECTRON SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 7 (03) : 215 - 232

[17] ICHIMURA S, 1983, SURF SCI, V124, pL49, DOI 10.1016/0039-6028(83)90791-4

[18] RATIO TECHNIQUE FOR MICRO-AUGER ANALYSIS [J]. SURFACE SCIENCE, 1977, 62 (01) : 277 - 292

[19] LEHERICY J, 1981, ANALUSIS, V9, P188

[20] MCGUIRE GE, 1979, AUGER ELECTRON SPECT