POSITRON REEMISSION MICROSCOPY AND ITS APPLICATIONS

被引：2

作者：

FRIEZE, WE

GIDLEY, DW

RICH, A

VANHOUSE, J

机构：

[1] Department of Physics, The University of Michigan, Ann Arbor

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1990年 / 299卷 / 1-3期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0168-9002(90)90814-M

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Positron re-emission microscopes (PRMs) are distinctly different from electron microscopes in the physical origin of their image contrasts. In a PRM, positrons of several keV energy are implanted into a sample and those positrons that are subsequently re-emitted at several eV are accelerated, focused and imaged. Contrast is produced by any process that affects the transport to, or re-emission from, the sample surface. After an introduction to the basic features of positron microscopy, applications of a PRM in four broad areas of research will be considered. These areas include: materials research, surface catalysis, microelectronic devices and biological systems.

引用

页码：409 / 412

页数：4

共 10 条

[1] SUBMICRON-RESOLUTION STUDY OF A THIN NI-CRYSTAL USING A BRIGHTNESS-ENHANCED POSITRON REEMISSION MICROSCOPE [J].