EFFECTS OF DOPING LEVELS AT SOURCE AND DRAIN REGIONS ON THE PERFORMANCE OF A-SI FET

被引:1
作者
KATOH, K [1 ]
IMAGI, S [1 ]
WATANABE, H [1 ]
机构
[1] SENDAI NATL COLL TECHNOL,KAMI,MIYAGI 98931,JAPAN
关键词
D O I
10.1049/el:19840727
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1064 / 1065
页数:2
相关论文
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