THE RELIABILITY OF SILICON AVALANCHE PHOTO-DIODES FOR USE IN OPTICAL-FIBER TRANSMISSION-SYSTEMS

被引：4

作者：

SIM, SP

机构：

来源：

关键词：

D O I：

10.1109/T-ED.1982.20922

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1611 / 1616

页数：6

共 9 条

[1]

BRAIN MC, COMMUNICATION

[2] SEMICONDUCTOR INSTABILITY FAILURE MECHANISMS REVIEW [J].

LYCOUDES, NE ;

CHILDERS, CC .

[3] MULTIPLICATION NOISE IN UNIFORM AVALANCHE DIODES [J].

MCINTYRE, RJ .

[4] PLANAR EPITAXIAL SILICON AVALANCHE PHOTO-DIODE [J].

MELCHIOR, H ;

HARTMAN, AR ;

SCHINKE, DP ;

SEIDEL, TE .

BELL SYSTEM TECHNICAL JOURNAL, 1978, 57 (06) :1791-1807

[5]

MILLARD R, 1980, THESIS U BIRMINGHAM

PERSONICK, SD .

BELL SYSTEM TECHNICAL JOURNAL, 1973, 52 (06) :843-874

[7]

REYNOLDS FH, 1974, P IEEE, V62, P185

[8]

SAH CT, 1962, IRE T ELECTRON DEV, VED9, P94, DOI DOI 10.1109/T-ED.1962.14895

[9]

1980, HDB RELIABILITY DATA