TRACE-ELEMENT ANALYSIS AND ELEMENT MAPPING BY SCANNING-X-RAY FLUORESCENCE AT DARESBURY SRS

被引：7

作者：

PRINS, M

DAVIES, ST

BOWEN, DK

机构：

[1] UNIV WARWICK,DEPT ENGN SCI,COVENTRY CV4 7AL,W MIDLANDS,ENGLAND

[2] SRC,DARESBURY LAB,SERC,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND

来源：

关键词：

D O I：

10.1016/0167-5087(84)90551-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：324 / 328

页数：5

共 13 条

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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (02) : 1243 - 1245
[8] THE DATA HANDLING FOR SPIXE MEASUREMENTS WITH THE EINDHOVEN CYCLOTRON
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 197 (01): : 165 - 169
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