METASTABLE IMPURITIES IN SEMICONDUCTORS - SI-MG AND SI-BE

被引：22

作者：

FROYEN, S

ZUNGER, A

机构：

来源：

PHYSICAL REVIEW B | 1986年 / 34卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.34.7451

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：7451 / 7454

页数：4

共 42 条

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