AN X-RAY STANDING WAVE INTERFERENCE SPECTROMETRIC ANALYSIS OF CHEMISORPTION OF SELENIUM ON SILICON(111) AND SILICON(220) SURFACES

被引：19

作者：

DEV, BN

THUNDAT, T

GIBSON, WM

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 03期

关键词：

D O I：

10.1116/1.573357

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：946 / 949

页数：4

共 7 条

[1] NEW APPLICATIONS OF X-RAY STANDING-WAVE FIELDS TO SOLID-STATE PHYSICS [J].

ANDERSEN, SK ;

GOLOVCHENKO, JA ;

MAIR, G .

PHYSICAL REVIEW LETTERS, 1976, 37 (17) :1141-1145

[2]

BEDZYK MJ, 1982, J VAC SCI TECHNOL, V20, P634, DOI 10.1116/1.571412

[3] 1ST-PRINCIPLES INVESTIGATION OF LOCATION AND ELECTRONIC-STRUCTURE OF ADSORBED HALOGEN ATOMS ON SEMICONDUCTOR SURFACES [J].

DEV, BN ;

MISHRA, KC ;

GIBSON, WM ;

DAS, TP .

PHYSICAL REVIEW B, 1984, 29 (02) :1101-1104

[4] AN X-RAY STANDING WAVE INTERFERENCE SPECTROMETRIC ANALYSIS OF CHEMISORPTION OF SELENIUM ON SILICON(111) AND SILICON(220) SURFACES [J].

DEV, BN ;

THUNDAT, T ;

GIBSON, WM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :946-949

[5] SOLUTION TO THE SURFACE REGISTRATION PROBLEM USING X-RAY STANDING WAVES [J].

GOLOVCHENKO, JA ;

PATEL, JR ;

KAPLAN, DR ;

COWAN, PL ;

BEDZYK, MJ .

PHYSICAL REVIEW LETTERS, 1982, 49 (08) :560-563

[6]

LAUE MV, 1935, ANN PHYS-LEIPZIG, V23, P705

[7]

MOHAPATRA SM, 1985, B AM PHYS SOC, V30, P363

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