1.3 MU-M INGAASP BURIED CRESCENT LASERS WITH COBALT-DOPED SEMI-INSULATING CURRENT BLOCKING LAYERS GROWN BY METALORGANIC CHEMICAL VAPOR-DEPOSITION

被引:5
作者
CHENG, WH [1 ]
POOLADDEJ, J [1 ]
HUANG, SY [1 ]
BUEHRING, KD [1 ]
APPELBAUM, A [1 ]
WOLF, D [1 ]
RENNER, D [1 ]
HESS, KL [1 ]
ZEHR, SW [1 ]
机构
[1] ROCKWELL INT CORP,THOUSAND OAKS,CA 91360
关键词
D O I
10.1063/1.99994
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1257 / 1259
页数:3
相关论文
共 10 条
[1]   NEW SEMIINSULATING INP - TITANIUM MIDGAP DONORS [J].
BRANDT, CD ;
HENNEL, AM ;
PAWLOWICZ, LM ;
WU, YT ;
BRYSKIEWICZ, T ;
LAGOWSKI, J ;
GATOS, HC .
APPLIED PHYSICS LETTERS, 1986, 48 (17) :1162-1164
[2]   HIGH-SPEED AND HIGH-POWER 1.3-MU-M INGAASP BURIED CRESCENT INJECTION-LASERS WITH SEMIINSULATING CURRENT BLOCKING LAYERS [J].
CHENG, WH ;
SU, CB ;
BUEHRING, KD ;
HUANG, SY ;
POOLADDEJ, J ;
WOLF, D ;
PERRACHIONE, D ;
RENNER, D ;
HESS, KL ;
ZEHR, SW .
APPLIED PHYSICS LETTERS, 1987, 51 (22) :1783-1785
[3]   LOW THRESHOLD 1.51-MU-M INGAASP BURINED CRESCENT INJECTION-LASERS WITH SEMIINSULATING CURRENT CONFINEMENT LAYER [J].
CHENG, WH ;
SU, CB ;
BUEHRING, KD ;
CHIEN, CP ;
URE, JW ;
PERRACHIONE, D ;
RENNER, D ;
HESS, KL ;
ZEHR, SW .
APPLIED PHYSICS LETTERS, 1986, 49 (21) :1415-1417
[4]   THE SINGLE-CRYSTAL GROWTH AND ELECTRICAL-PROPERTIES OF COBALT-DOPED INDIUM-PHOSPHIDE [J].
COCKAYNE, B ;
MACEWAN, WR ;
BROWN, GT .
JOURNAL OF CRYSTAL GROWTH, 1981, 55 (02) :263-267
[5]  
HESS KL, IN PRESS 4TH P INT C
[6]  
ISELER GW, 1979, I PHYS C SER, V45, P144
[7]  
NAHORY RE, 1982, I PHYS C SER, V65, P7
[8]   HIGH-RESISTIVITY (GREATER-THAN-10(5)-OMEGA-CM) INP LAYERS BY LIQUID-PHASE EPITAXY [J].
REZEK, EA ;
ZINKIEWICZ, LM ;
LAW, HD .
APPLIED PHYSICS LETTERS, 1983, 43 (04) :378-380
[9]   BH INGAASP LASERS WITH AN LPE GROWN SEMIINSULATING LAYER [J].
SHI, SL ;
YU, PKL .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (06) :L435-L436
[10]   THE IDENTIFICATION OF PRECIPITATE PHASES IN FE-DOPED INP SINGLE-CRYSTALS [J].
SMITH, NA ;
HARRIS, IR ;
COCKAYNE, B ;
MACEWAN, WR .
JOURNAL OF CRYSTAL GROWTH, 1984, 68 (02) :517-522