DEPENDENCE OF X-RAY YIELDS ON DIFFERENT PARAMETERS FOR LIGHT-ELEMENT MATRICES IN THICK TARGET PIXE AND USE OF STANDARDS FOR CALIBRATION IN SUCH ANALYSIS

被引:6
作者
KHALIQUZZAMAN, M [1 ]
LAM, ST [1 ]
SHEPPARD, DM [1 ]
STEPHENSNEWSHAM, LG [1 ]
机构
[1] UNIV ALBERTA,FAC PHARM,EDMONTON T6G 2N8,ALBERTA,CANADA
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 216卷 / 03期
关键词
D O I
10.1016/0167-5087(83)90516-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:481 / 488
页数:8
相关论文
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