SCANNING TUNNELING MICROSCOPE WITH LARGE SCAN RANGE

被引：5

作者：

ADAMCHUK, VK

ERMAKOV, AV

FEDOSEENKO, SI

机构：

[1] Institute of Physics, St. Petersburg State University, St. Petersburg

来源：

ULTRAMICROSCOPY | 1992年 / 42卷

关键词：

D O I：

10.1016/0304-3991(92)90491-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A new design is described for a scanning tunneling microscope (STM) intended for the detailed characterization of surfaces of industrial or technological interest. The instrument used was designed specifically for modern technology and precision engineering: large scan range (up to 200-mu-m lateral, 12-mu-m vertical) at low operating voltage (below 300 V), operation in ambient air, automated and computerized control.

引用

页码：1602 / 1605

页数：4

共 6 条

[1]

ADAMCHUK VK, 1988, LETT J EXP THEOR PHY, V14, P256

[2]

ADAMCHUK VK, 1989, REV SCI INSTRUM, P182

[3]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[4] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[5] LONG-SCAN IMAGING BY SCANNING TUNNELING MICROSCOPY [J].

CANTU, RG ;

GARNICA, MAH .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :354-356

[6] SCANNING TUNNELING MICROSCOPY OF MACHINED SURFACES [J].

GEHRTZ, M ;

STRECKER, H ;

GRIMM, H .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :432-435

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