SCANNING TUNNELING MICROSCOPY OF MACHINED SURFACES

被引:20
作者
GEHRTZ, M
STRECKER, H
GRIMM, H
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期
关键词
D O I
10.1116/1.575389
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:432 / 435
页数:4
相关论文
共 10 条
  • [1] AUTOMATED SCANNING TUNNELING MICROSCOPE
    BAPST, UH
    [J]. SURFACE SCIENCE, 1987, 181 (1-2) : 157 - 164
  • [2] APPLICATION TO BIOLOGY AND TECHNOLOGY OF THE SCANNING TUNNELING MICROSCOPE OPERATED IN AIR AT AMBIENT PRESSURE
    BARO, AM
    MIRANDA, R
    CARRASCOSA, JL
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 380 - 395
  • [3] BINNIG G, 1986, IBM J RES DEV, V30, P355
  • [4] BROWN NJ, 1983, P SOC PHOTO-OPT INST, V381, P48
  • [5] SCANNING TUNNELING MICROSCOPY APPLIED TO OPTICAL-SURFACES
    DRAGOSET, RA
    YOUNG, RD
    LAYER, HP
    MIELCZAREK, SR
    TEAGUE, EC
    CELOTTA, RJ
    [J]. OPTICS LETTERS, 1986, 11 (09) : 560 - 562
  • [6] GARCIA N, 1987, SURF SCI, V181
  • [7] TECHNOLOGICAL APPLICATIONS OF SCANNING TUNNELING MICROSCOPY AT ATMOSPHERIC-PRESSURE
    MIRANDA, R
    GARCIA, N
    BARO, AM
    GARCIA, R
    PENA, JL
    ROHRER, H
    [J]. APPLIED PHYSICS LETTERS, 1985, 47 (04) : 367 - 369
  • [8] SCANNING TUNNELING MICROSCOPY OF METAL-SURFACES IN AIR
    MORITA, S
    OKADA, T
    ISHIGAME, Y
    MIKOSHIBA, N
    [J]. SURFACE SCIENCE, 1987, 181 (1-2) : 119 - 125
  • [9] WIDE-RANGE, LOW-OPERATING-VOLTAGE, BIMORPH STM - APPLICATION AS POTENTIOMETER
    MURALT, P
    POHL, DW
    DENK, W
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 443 - 450
  • [10] SOME DESIGN CRITERIA IN SCANNING TUNNELING MICROSCOPY
    POHL, DW
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 417 - 427