LONG-SCAN IMAGING BY SCANNING TUNNELING MICROSCOPY

被引：7

作者：

CANTU, RG ^{[1
]}

GARNICA, MAH ^{[1
]}

机构：

[1] INST POLITECN NACL,CTR INVEST & ESTUD AVANZADOS,DEPT PHYS,SECC METROL,MEXICO CITY 07000,DF,MEXICO

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.576395

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Results are presented of long scan imaging obtained with a scanning tunneling microscope designed to cover a measuring volume of up to 40x40x25 /im3. 316-L austenitic steel and Vickers hardness indentation images are shown. A modulation technique is discussed which improves long scan operation and also identifies if the tip is touching slightly. It is shown that, even in this case, it is possible to achieve high repetition of long scan imaging. © 1990, American Vacuum Society. All rights reserved.

引用

页码：354 / 356

页数：3

共 11 条

[1]

AHANMIR JJ, 1988, APPL PHYS LETT, V52, P2086

[2] ULTRALOW-LOAD HARDNESS TESTER FOR USE IN A SCANNING ELECTRON-MICROSCOPE [J].