TRANSMISSION ELECTRON-MICROSCOPY OF TRANSVERSE SECTIONS THROUGH OXIDE SCALES ON METALS

被引：16

作者：

TINKER, M

LABUN, PA

机构：

来源：

OXIDATION OF METALS | 1982年 / 18卷 / 1-2期

关键词：

D O I：

10.1007/BF00656093

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

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页码：27 / 40

页数：14

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共 5 条

[1] METHOD FOR CROSS-SECTIONAL EXAMINATION OF MOLECULAR SEMICONDUCTOR-METAL FILM JUNCTIONS USING TRANSMISSION ELECTRON-MICROSCOPY
KATZ, W
EVANS, CA
EATON, DR
FAULKNER, LR
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (04): : 1561 - 1564
[2] METHOD OF PREPARING TEM FOILS FROM THICK OXIDES AND METAL-OXIDE INTERFACES
MANNING, MI
ROWLANDS, PC
[J]. BRITISH CORROSION JOURNAL, 1980, 15 (04): : 184 - 189
[3] ADVANCES IN TRANSMISSION ELECTRON-MICROSCOPE TECHNIQUES APPLIED TO DEVICE FAILURE ANALYSIS
SHENG, TT
MARCUS, RB
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : 737 - 743
[4] THIN-FILM TRANSMISSION ELECTRON-MICROSCOPY OF SULFURIC-ACID ANODIZED FILMS BY DIRECT VERTICAL SECTIONING
TUCK, CDS
[J]. CORROSION SCIENCE, 1977, 17 (09) : 777 - &
[5] WATSON FA, 1981, METALL MATER TECHNOL, P310