CHEMICALLY ETCHED SILICON SURFACES VIEWED AT THE ATOMIC LEVEL BY FORCE MICROSCOPY

被引：42

作者：

KIM, Y ^{[1
]}

LIEBER, CM ^{[1
]}

机构：

[1] COLUMBIA UNIV,DEPT CHEM,NEW YORK,NY 10027

来源：

关键词：

D O I：

10.1021/ja00006a079

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

[No abstract available]

引用

页码：2333 / 2335

页数：3

共 23 条

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