CONTINUOUS X-RAY-INDUCED AUGER MICROPROBE ANALYSIS AND MICROSCOPY - 1ST RESULTS

被引：10

作者：

NASSIOPOULOS, AG

GRAMARI, D

CAZAUX, J

机构：

来源：

SURFACE SCIENCE | 1983年 / 129卷 / 01期

关键词：

D O I：

10.1016/0039-6028(83)90106-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：247 / 264

页数：18

共 25 条

[1] BACK SCATTERING OF ELECTRONS [J].

ARCHARD, GD .

JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) :1505-&

[2]

BAUER HE, 1980, ELECTRON MICROS, V3, P211

[3] PHOTOELECTRON SPECTROMICROSCOPY [J].

BEAMSON, G ;

PORTER, HQ ;

TURNER, DW .

NATURE, 1981, 290 (5807) :556-561

[4] UTILITY OF BREMSSTRAHLUNG-INDUCED AUGER PEAKS [J].

CASTLE, JE ;

WEST, RH .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 16 (03) :195-197

[5] X-RAY PHOTOELECTRON MICROANALYSIS AND MICROSCOPY - PRINCIPLE AND EXPECTED PERFORMANCES [J].

CAZAUX, J .

REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (05) :263-280

[6]

CAZAUX J, 1982, APPL SURF SCI, V10, P124, DOI 10.1016/0378-5963(82)90140-4

[7]

CAZAUX J, 1979, J MICROSC SPECT ELEC, V4, P319

[8] CONTINUOUS X-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPY [J].

CAZAUX, J ;

DUC, TM .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1983, 31 (01) :13-23

[9] SCANNING-X-RAY RADIOGRAPHY - 1ST TESTS IN AN ELECTRON SPECTROMETER [J].

CAZAUX, J ;

MOUZE, D ;

PERRIN, J .

JOURNAL OF APPLIED PHYSICS, 1982, 53 (04) :3299-3302

[10]

CAZAUX J, 1982, I PHYS C SER, V61, P425

← 1 2 3 →