INSTRUMENT FOR RESEARCH ON INTERFACES AND SURFACES

被引：70

作者：

BONNELLE, C

VERGAND, F

JONNARD, P

ANDRE, JM

STAUB, PF

AVILA, P

CHARGELEGUE, P

FONTAINE, MF

LAPORTE, D

PAQUIER, P

RINGUENET, A

RODRIGUEZ, B

机构：

[1] Laboratoire de Chimie Physique - Matière et Rayonnement, Université Pierre et Marie Curie, URA 176, 75321 Paris Cedex 05

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1994年 / 65卷 / 11期

关键词：

D O I：

10.1063/1.1144524

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe an instrument designed for studying the electronic structure of bulk, surface, and deep solid-solid interface. The analysis is made by soft-x-ray emission spectroscopy induced by electron bombardment. The target is placed under ultrahigh vacuum and can be prepared and treated in situ. High resolution is achieved both as concerns the photon energy and the electron-beam energy. Tests have been made in the dispersive mode and in the characteristic isochromat mode. In both cases experimental resolution is in good agreement with the expected one.

引用

页码：3466 / 3471

页数：6

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