ELECTRONIC CHARACTERIZATION OF DEEP AL-INP INTERFACES

被引：5

作者：

BARRET, C ^{[1
]}

VERGAND, F ^{[1
]}

MAAREF, H ^{[1
]}

SENEMAUD, C ^{[1
]}

BONNELLE, C ^{[1
]}

机构：

[1] UNIV PIERRE & MARIE CURIE, CHIM PHYS LAB, F-75231 PARIS 05, FRANCE

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1989年 / 24卷 / 04期

关键词：

D O I：

10.1051/rphysap:01989002404043900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：439 / 446

页数：8

共 38 条

[1] ELECTRICAL CHARACTERIZATION OF METAL-SEMICONDUCTOR INTERFACES [J].

BARRET, C ;

LU, GN ;

NEFFATI, T .

REVUE DE PHYSIQUE APPLIQUEE, 1987, 22 (11) :1485-1493

[2] STUDY OF METAL-SEMICONDUCTOR INTERFACE STATES USING SCHOTTKY CAPACITANCE SPECTROSCOPY [J].

BARRET, C ;

CHEKIR, F ;

VAPAILLE, A .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1983, 16 (12) :2421-2438

[3] THE STRUCTURE AND PROPERTIES OF METAL-SEMICONDUCTOR INTERFACES [J].

Brillson, L. J. .

SURFACE SCIENCE REPORTS, 1982, 2 (02) :123-326

[4]

BRILLSON LJ, 1978, J VAC SCI TECHNOL, V15, P1378, DOI 10.1116/1.569792

[5] A STUDY OF INTERFACE STATES IN METAL-GAAS (110) STRUCTURES BY SCHOTTKY CAPACITANCE SPECTROSCOPY [J].

CHEKIR, F ;

BARRET, C ;

VAPAILLE, A .

JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) :6474-6480

[6] IMPROVED SCHOTTKY CAPACITANCE SPECTROSCOPY METHOD FOR THE STUDY OF INTERFACE STATES IN METAL-SEMICONDUCTOR JUNCTIONS [J].

CHEKIR, F ;

BARRET, C .

APPLIED PHYSICS LETTERS, 1984, 45 (11) :1212-1214

[7] NONLOCAL PSEUDOPOTENTIAL CALCULATIONS FOR ELECTRONIC-STRUCTURE OF 11 DIAMOND AND ZINCBLENDE SEMICONDUCTORS [J].

CHELIKOWSKY, JR ;

COHEN, ML .

PHYSICAL REVIEW B, 1976, 14 (02) :556-582

[8] MATERIAL REACTIONS AND BARRIER HEIGHT VARIATIONS IN SINTERED AL-INP SCHOTTKY DIODES [J].

CHRISTOU, A ;

ANDERSON, WT .

SOLID-STATE ELECTRONICS, 1979, 22 (10) :857-863

[9] RECOMBINATION VELOCITY EFFECTS ON CURRENT DIFFUSION AND IMREF IN SCHOTTKY BARRIERS [J].

CROWELL, CR ;

BEGUWALA, M .

SOLID-STATE ELECTRONICS, 1971, 14 (11) :1149-&

[10] SURFACE STRUCTURAL DAMAGE PRODUCED IN INP(100) BY RF PLASMA OR SPUTTER DEPOSITION [J].

DAUTREMONTSMITH, WC ;

FELDMAN, LC .

THIN SOLID FILMS, 1983, 105 (02) :187-196

← 1 2 3 4 →