ELECTRONIC CHARACTERIZATION OF DEEP AL-INP INTERFACES

被引：5

作者：

BARRET, C ^{[1
]}

VERGAND, F ^{[1
]}

MAAREF, H ^{[1
]}

SENEMAUD, C ^{[1
]}

BONNELLE, C ^{[1
]}

机构：

[1] UNIV PIERRE & MARIE CURIE, CHIM PHYS LAB, F-75231 PARIS 05, FRANCE

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1989年 / 24卷 / 04期

关键词：

D O I：

10.1051/rphysap:01989002404043900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：439 / 446

页数：8

共 38 条

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