THE PURITY OF TUNGSTEN HEXAFLUORIDE DETERMINED BY FOURIER-TRANSFORM MASS-SPECTROMETRY

被引：6

作者：

REENTS, WD

GREEN, ML

ALI, YS

机构：

[1] AT&T Bell Lab, Murray Hill, NJ,, USA, AT&T Bell Lab, Murray Hill, NJ, USA

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1988年 / 135卷 / 03期

关键词：

D O I：

10.1149/1.2095750

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：780 / 782

页数：3

共 16 条

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