ARXPS-STUDIES, SEM-STUDIES, AND SAM-STUDIES OF HIGHLY TEXTURED YBA2CU3OX-FILMS

被引：7

作者：

HALBRITTER, J

HAUSER, B

KEIM, EG

MATHES, HJ

WALK, P

ROGALLA, H

机构：

[1] UNIV KARLSRUHE,IEKP,D-7500 KARLSRUHE,FED REP GER

[2] TWENTE UNIV TECHNOL,FAC APPL PHYS,7500 AE ENSCHEDE,NETHERLANDS

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1989年 / 25卷 / 02期

关键词：

D O I：

10.1109/20.92775

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2328 / 2332

页数：5

共 25 条

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[5] INSITU RESISTANCE OF Y1BA2CU3OX FILMS DURING ANNEAL [J].

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[6]

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[7] ORIENTATION DEPENDENCE OF GRAIN-BOUNDARY CRITICAL CURRENTS IN YBA2CU3O7-DELTA BICRYSTALS [J].

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[8] NEAR-SURFACE ATOMIC SEGREGATION IN YBCO THIN-FILMS [J].

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PHYSICA C, 1988, 153 (02) :1435-1436

[9]

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[10] ARXPS-STUDIES OF C-AXIS TEXTURED YBA2CU3OX-FILMS [J].

HALBRITTER, J ;

WALK, P ;

MATHES, HJ ;

HAEUSER, B ;

ROGALLA, H .

PHYSICA C, 1988, 153 :127-128

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