ON ANGLE RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY OF OXIDES, SERRATIONS, AND PROTUSIONS AT INTERFACES

被引:36
作者
DARLINSKI, A [1 ]
HALBRITTER, J [1 ]
机构
[1] KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH,INST KERNPHYS 2,D-7500 KARLSRUHE 1,FED REP GER
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词
D O I
10.1116/1.574779
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:1235 / 1240
页数:6
相关论文
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